The epitaxial growth of cubic BiFeO3 ultrathin films on SrTiO3 (001) substrates by off-axis RF sputtering is demonstrated, suitable to X-ray spectroscopies interface investigation. X-ray photoelectron diffraction is used as a tool to probe the long-range crystal order and to track the transition from amorphous to epitaxial growth as a function of deposition parameters. Further spectroscopic measurements, in particular, X-ray linear dichroism on the Fe L 3, 2 edge, confirm the heteroepitaxial growth of BiFeO3 and clearly indicate a 3+ valence state for the iron cation. Finally, XPS is used to reconstruct the band alignment diagram, which results in a staggered configuration with a remarkable energy shift of the SrTiO3 band edges which can ultimately favor the n-type doping of SrTiO3.

Tracking the amorphous to epitaxial transition in RF-sputtered cubic BFO-STO heterojunctions by means of X-ray photoelectron diffraction / Giampietri, A.; Drera, G.; Pis, I.; Magnano, E.; Sangaletti, L.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 109:13(2016), p. 132903. [10.1063/1.4963787]

Tracking the amorphous to epitaxial transition in RF-sputtered cubic BFO-STO heterojunctions by means of X-ray photoelectron diffraction

Giampietri A.;
2016

Abstract

The epitaxial growth of cubic BiFeO3 ultrathin films on SrTiO3 (001) substrates by off-axis RF sputtering is demonstrated, suitable to X-ray spectroscopies interface investigation. X-ray photoelectron diffraction is used as a tool to probe the long-range crystal order and to track the transition from amorphous to epitaxial growth as a function of deposition parameters. Further spectroscopic measurements, in particular, X-ray linear dichroism on the Fe L 3, 2 edge, confirm the heteroepitaxial growth of BiFeO3 and clearly indicate a 3+ valence state for the iron cation. Finally, XPS is used to reconstruct the band alignment diagram, which results in a staggered configuration with a remarkable energy shift of the SrTiO3 band edges which can ultimately favor the n-type doping of SrTiO3.
2016
RF Sputtering, X-Ray Photoelectron Diffraction, BiFeO3/SrTiO3
01 Pubblicazione su rivista::01a Articolo in rivista
Tracking the amorphous to epitaxial transition in RF-sputtered cubic BFO-STO heterojunctions by means of X-ray photoelectron diffraction / Giampietri, A.; Drera, G.; Pis, I.; Magnano, E.; Sangaletti, L.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 109:13(2016), p. 132903. [10.1063/1.4963787]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1550067
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